To do a flash comparison that doesn’t involve actual field testing for each storage device being considered but also provides a close apples-to-apples comparison, we must create a scenario that removes as many external or situational variables as possible. We must limit the activity of the device to a controlled environment with consistent data transfer activity (and it is still hypothetical).
Due to the unique pattern of usage discussed in estimating a device’s useful life, we need a few defined variables when trying to get as close to a level comparison as possible. In doing so, we eliminate any drive activity that would be unique to the usage environment and create an unpredictable pattern of usage that would corrupt the comparison. To do this we must remove the variable of random transfer activity and assume sequential transfer activity.
Scenario – Here we have a usage environment that is continuously writing data to the solid state drive starting with LBA0 (logical block address) to LBAn. The write speed for the data transfer is maximized and because the controller is continuously writing data across the entire drive, the impact of independent but unpredictable features such as wear-leveling and garbage collection are minimized.
Fill in the specifications below to compare an SLC to MLC solid state device: